Scanning Electron Microscopes
JEOL JEM – IT 810
The JEOL JSM-IT810 SEM is a high-resolution Field Emission Scanning Electron Microscope (FE-SEM) with a Schottky electron source. The instrument provides exceptional image quality and is equipped with both window and windowless JEOL EDS detectors for elemental characterisation and mapping, including improved analysis of light elements. An air-sensitive transfer vessel is available for the examination of oxygen- and moisture-sensitive materials, allowing samples to be transferred and analysed with minimal atmospheric exposure. The system is suitable for advanced imaging and analytical characterisation of a wide range of materials.
ThermoFisher (FEI) Helios G4 PFIB UXe DualBeam
- High resolution imaging (sub-nm)
- DualBeam system (multi-species, Xe, Ar, N, O)
- Energy dispersive spectroscopy (EDS) Oxford Ultim Max and Ultim Extreme SDD detectors
- Oxford C-Nano Electron backscatter diffraction (EBSD)
- Multi-position STEM detector (6)
Zeiss Supra 55VP SEM with Raith Elphy Plus E-beam Lithography System & EBSD
The Zeiss Supra 55VP SEM is a high resolution Field Emission Scanning Electron Microscopes (FESEM) with a Schottky source. Its high efficiency in-lens detector produces exceptional quality scanning electron images down to 0.1kV and BSE, Everhart-Thornley SE and VPSE detectors may also be used for imaging. An Oxford EDS system is also available for elemental characterisation as is an Oxford Electron Backscatter Diffraction (EBSD) system for crystal orientation analysis and mapping.
Zeiss Supra 55VP SEM
Zeiss EVO LS15 SEM
The Zeiss Evo LS15 is a life science themed thermionic tungsten electron gun Scanning Electron Microscope which is used for imaging features on the micron scale. The pressure range is 10 - 3000 Pa (air or water vapour) and it is equipped with a Peltier-colled Carl Zeiss coolstage that can control temperatures down to -25°C. This SEM is also equipped with a Bruker SDD XFlash 5030 detector which allows high speed elemental analysis and mapping.
Zeiss EVO LS15 SEM
FEI Quanta 200 ESEM with cathodoluminescence
The FEI Quanta 200 Environmental Scanning Electron Microscope (ESEM) is a thermal tungsten gun instrument capable of imaging under three vacuum regimes, High-vacuum (< 6e-4 Pa), Low-vacuum (10 - 130 Pa) and ESEM-vacuum (10 - 2600 Pa). The Quanta is equipped with several CCD detectors for high speed cathodoluminescence spectra aquisition. A Gatan C1002 liquid nitrogen cold stage is available for cooling samples to 80 K while a Gatan CF302 continuous flow liquid helium cold stage is available for cooling to 5 K. A Melles Griot HeCd 100 mW dual wavelength laser is available for simultaneous PL studies with excitation at 325 and 442 nm.
FEI Quanta 200 ESEM with cathodoluminescence
Transmission Electron Microscope
JEOL JEM F200 TEM
The JEOL JEM F200 is a 200kV TEM with both single and double-tilt holders that can be used for imaging of both materials and biological specimens as well as for Scanning Transmission Electron Microscopy (STEM). It is equipped with a Gatan Rio 4k x 4k camera for high quality digital images. It can also be operated at 120kV.
JEOL JEM F200 TEM
Electron Microscopy Sample Preparation
Leica EM TIC 3X
It is a triple ion beam cross-section polisher and surface preparation system for electron microscopy applications. The instrument uses broad argon ion beams to produce large, high-quality cross-sections and polished surfaces with minimal mechanical deformation or preparation artefacts. It is particularly suited to the preparation of metals, ceramics, semiconductors, composites, and other advanced materials for high-resolution SEM imaging and microanalysis
Leica EM ACE600 High Vacuum Coater
This high vacuum coater is equipped with both a carbon thread evaporation and metal deposition system. Carbon coating is used where a sample is being imaged in a high vacuum environment where EDS analysis will be performed, whereas a coating of Au/Pd is used for high resolution imaging. It also has glow discharge available for TEM grids or for specimen cleaning prior to coating.
Leica EM ACE600 High Vacuum Coater
Quorum Q150V S Plus Sputter Coater
This coater is a versatile sample preparation system designed for the deposition of ultra-thin conductive coatings on non-conductive specimens prior to electron microscopy analysis. The instrument enables high-quality coating with materials such as gold, platinum, reducing charging effects and improving image resolution and analytical performance in scanning electron microscopy. The Q150V S Plus is equipped with a turbomolecular pumping system and allows precise control of coating thickness, ensuring reproducible sample preparation for a wide range of materials and biological specimens.
